کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5368861 | 1388410 | 2006 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Time-of-Flight (TOF) static secondary ion mass spectrometry (S-SIMS) was used to gain molecular information on the surface modifications introduced by plasma treatment of polypropylene (PP) films. A procedure using slotted electron microscopy grids was developed to deal with the charge build-up of samples with a thickness of about 30 μm. The surface composition was studied as a function of the plasma treatment time. A comparison of the mass spectra from untreated and treated PP showed significant differences of signal intensities of ions that could be specifically related to the presence of oxygen-containing species.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 19, 30 July 2006, Pages 6660-6663
Journal: Applied Surface Science - Volume 252, Issue 19, 30 July 2006, Pages 6660-6663
نویسندگان
Bart Boschmans, Myriam Vanneste, Luc Ruys, Eef Temmerman, Christophe Leys, Luc Van Vaeck,