کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5369874 | 1388460 | 2007 | 9 صفحه PDF | دانلود رایگان |

X-ray reflectivity and non-specular crystal truncation rod scans have been used to determine the three-dimensional atomic structure of the buried CaF2-Si(1â1â1) interface and ultrathin films of MnF2 and CaF2 within a superlattice. We show that ultrathin films of MnF2, below a critical thickness of approximately four monolayers, are crystalline, pseudomorphic, and adopt the fluorite structure of CaF2. High temperature deposition of the CaF2 buffer layer produces a fully reacted, CaF2-Si(1â1â1) type-B interface. The mature, “long” interface is shown to consist of a partially occupied layer of CaF bonded to the Si substrate, followed by a distorted CaF layer. Our atomistic, semi-kinematical scattering method extends the slab reflectivity method by providing in-plane structural information.
Journal: Applied Surface Science - Volume 253, Issue 8, 15 February 2007, Pages 3991-3999