کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5370120 | 1388475 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy](/preview/png/5370120.png)
چکیده انگلیسی
Scanning Auger microscopy and micro-Raman spectroscopy are combined to characterize a Co-Se thin film sample, containing 84Â at.% Se, which had been modified in localized areas following excitation with an intense focused Ar+ laser (514.5Â nm). The information obtained helps to establish that a previous assignment for a Co-Se sample of Raman features between 168 and 175Â cmâ1 actually refers to an oxygenated Co-Se species, and that Co-Se interactions in a Se-rich environment give rise to Raman structure between 181 and 184Â cmâ1. Comparisons are made for the use of Ar+ and HeNe laser sources for Raman measurements in this context; the latter in general gives both better resolution and better signal-to-noise characteristics.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 253, Issue 3, 30 November 2006, Pages 1130-1134
Journal: Applied Surface Science - Volume 253, Issue 3, 30 November 2006, Pages 1130-1134
نویسندگان
M. Teo, P.C. Wong, L. Zhu, D. Susac, S.A. Campbell, K.A.R. Mitchell, R.R. Parsons, D. Bizzotto,