Characterization of conductance under finite bias for a self-assembled monolayer coated Au quantized point contact

We have demonstrated that an experimental cross-wire junction set-up can be used to measure the I-V characteristics of a self-assembled monolayer (SAM) stabilized metal quantized point contact. The increased stability due to the presence of the SAM allows the measurement of the I-V characteristics. However, the SAM also provides additional conductance paths in addition to the pure metal point contact. The presence of the SAM may contribute to the non-integral quantum conductance transition and the non-linear I-V characteristics of the quantum contact. Nonetheless, a straight I-V curve is obtained for the Au quantized point contact from 0 to 1 V with a conductance of approximately 1G0, in contrast to previous work reported in the literature.