کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5370273 | 1388479 | 2006 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ion beam induced crystal-edge nanoclusters at the origin of poly(ethylene glycol) film stabilization
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Ion beam induced crystal-edge nanoclusters at the origin of poly(ethylene glycol) film stabilization Ion beam induced crystal-edge nanoclusters at the origin of poly(ethylene glycol) film stabilization](/preview/png/5370273.png)
چکیده انگلیسی
PEG films stabilized by noble gas ion beam irradiation showed characteristic clustering at the crystal edges. These structures appear in determined ion beam conditions after exposure to Ar and Kr ions. Atomic force microscopy exploration indicates that, rather than presenting drastic topographic features, the nanostructures show radically different elastic properties. Within the concerned set of ion beam conditions, the surface properties are observed to vary according to the absorbed energy as suggested by X-ray photoelectron spectroscopy and contact angle measurements. These analyses predict that Ar irradiation in the 500-600Â V extraction potential range is an appropriate condition for PEG stabilization.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 253, Issue 2, 15 November 2006, Pages 810-813
Journal: Applied Surface Science - Volume 253, Issue 2, 15 November 2006, Pages 810-813
نویسندگان
M. Manso, A. Valsesia, G. Ceccone, F. Rossi,