کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5370360 | 1388483 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction Structural investigation of thin tetracene films on flexible substrate by synchrotron X-ray diffraction](/preview/png/5370360.png)
چکیده انگلیسی
Structural properties of tetracene thin films grown by vacuum sublimation on a flexible Mylar© substrate have been investigated by means of synchrotron X-ray diffraction. The films are polycrystalline and are made up of crystalline domains oriented with the (0 0 l) planes almost parallel to the substrate and completely misoriented around the surface normal. Two crystallographic phases (α and β thin film phases) have been identified. They differ for the dh k l interplanar spacing, both larger than that of the bulk. As a comparison, results from tetracene films grown on SiO2 have been reported to investigate the different charge transport properties of films grown on Mylar and on SiO2 substrates.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 22, 15 September 2006, Pages 8022-8027
Journal: Applied Surface Science - Volume 252, Issue 22, 15 September 2006, Pages 8022-8027
نویسندگان
S. Milita, C. Santato, F. Cicoira,