کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5370435 1388494 2006 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Formation and characterization of conductive thin layers of copper sulfide (CuxS) on the surface of polyethylene and polyamide by the use of higher polythionic acids
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Formation and characterization of conductive thin layers of copper sulfide (CuxS) on the surface of polyethylene and polyamide by the use of higher polythionic acids
چکیده انگلیسی
Layers of copper sulfide of varying composition and properties are formed on the surface of polyethylene and polyamide by a sorption-diffusion method using solutions of higher polythionic acids, H2SnO6. The concentration of sulfur adsorbed-diffused into PE and PA depends on the degree of the acid sulfurity, n, the temperature of the solution and the period of the polymer treatment. The amount of copper in a sulfide (CuxS) layer formed after the sulfured polymer treatment with a solution of Cu(I-II) salt is strongly dependent on the concentration of sulfur in the PE and PA. By the chemical analysis of the obtained sulfide layers was determined that a value of x in the CuxS layers varies in the interval 1 < x < 2. The microscopic investigation of transverse sections of PE and PA samples with copper sulfide layers showed that the major part of copper sulfide is in the surface matrix of the polymer. X-ray diffraction studies of the CuxS layers obtained seven phases: with x = 2 (chalcocite), 1.9375 (djurleite), 1.8 (digenite), 1.75 (anilite), 1.12 (yarrowite), 1.06 (talnakhite) and 1 (covellite). The measurements of the electrical conductance of CuxS layers (0.1-4 S cm−2) showed that its value greatly depends on the conditions of PE and PA interaction with H2SnO6 and of further interaction with Cu(I-II) salt solution, on the chemical and phase composition of the layer.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 12, 15 April 2006, Pages 4218-4225
نویسندگان
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