Analysis of valence XPS and AES of C, N, O, and F-containing substances by DFT calculations using the model molecules

Analysis of valence XPS and AES of C, N, O, and F-containing substances by DFT calculations using the model molecules

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Chemical Physics - Volume 452, 1 May 2015, Pages 31-39

Kazunaka Endo, Kenji Hyodo, Kazuchiyo Takaoka, Tomonori Ida, Shingo Shimada, Yusuke Takagi, Ernst Z. Kurmaev,