Chemical effect on the L X-ray cross-sections and average fluorescence yields of Hf compounds

Chemical effects on the L X-ray production cross-sections (σLℓ, σLα, σLβ, and σLγ) and the average fluorescence yield (ϖL) for Hf compounds were investigated. In this study, the samples were excited by 123.6 keV γ-rays from a 57Co annular radioactive source. L X-rays emitted by samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. We observed a chemical effect on the L X-ray cross-sections and average fluorescence yield for Hf compounds. However, the σLℓ cross-section; dependence on the chemical state of Hf compounds is almost negligible. The experimental values have been compared with the theoretically calculated values of pure Hf.