Structure of ultra-thin silicon film on HOPG studied by polarization-dependence of X-ray absorption fine structure

Structure of ultra-thin silicon film on HOPG studied by polarization-dependence of X-ray absorption fine structure

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Chemical Physics Letters - Volume 594, 20 February 2014, Pages 64-68

Y. Baba, I. Shimoyama, N. Hirao, T. Sekiguchi,