Lateral displacement in soft-landing process and electronic properties of size-selected Pt7 clusters on the aluminum oxide film on NiAl(1Â 1Â 0)

- Soft-landed Pt7 clusters transiently migrate on the Al2O3/NiAl(1 1 0) surface.
- The mean lateral displacement by transient migration is estimated to be ∼8 nm.
- Pt7 clusters lay flat with a planar structure.
- Domain boundaries of the Al2O3 film are preferential adsorption sites.
- Pt7 clusters have discrete unoccupied states in the Al2O3 bandgap.