کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5421938 1507898 2015 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Preparation and characterization of ultraflat Pt facets by atom-height-resolved differential optical microscopy
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Preparation and characterization of ultraflat Pt facets by atom-height-resolved differential optical microscopy
چکیده انگلیسی
We recently demonstrated that improvements to our technique, laser confocal microscopy with differential interference microscopy (LCM-DIM), has rendered it fully capable of resolving monatomic steps with heights of ca. 0.25 nm on Au(111) and Pd(111) surfaces, even as low as 0.14 nm on Si(100), in aqueous solution. In this paper, we describe in detail a method to prepare and characterize, via atomic-layer-resolved LCM-DIM, ultraflat Pt(111) and Pt(100) facets over a wide surface area. The preparation of ultraflat surfaces is important in the characterization at the atomic scale of electrochemical processes under reaction conditions. To showcase the elegance of LCM-DIM, the anodic dissolution of Pt in aqueous HCl is briefly recounted.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 631, January 2015, Pages 57-62
نویسندگان
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