کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5423729 1507949 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)
چکیده انگلیسی
Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré pattern induced by NaCl-Cu lattice mismatch also shows bias dependence. The z-V (dz/dV-V) curves and dI/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 604, Issues 19–20, September 2010, Pages 1820-1824
نویسندگان
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