کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5424494 | 1395826 | 2008 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Field-assisted oxygen etching for sharp field-emission tip
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
A simple and repeatable modification technique for single-crystal tungsten ã1Â 1Â 1ã oriented tips is reported. The modification technique was based on field-assisted oxygen etching of the peripheral tungsten atoms of the tip apex. Field-ion microscopy (FIM) was used to etch and to visualize the real-time etching events, and field emission patterns were observed at the same geometry. During modification via controlled etching of the tungsten tip, the FIM bias typically decreased from 4.4Â kV to 1.6Â kV. This bias change corresponded to a reduction of the radius of curvature from 10Â nm to 3Â nm. The sharpened tips emitted electrons at low- or extremely low-bias voltages with good geometrical confinement. The shape of the etched tip and the features of field emission were evaluated by field evaporation and Fowler-Nordheim plots.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 602, Issue 12, 15 June 2008, Pages 2128-2134
Journal: Surface Science - Volume 602, Issue 12, 15 June 2008, Pages 2128-2134
نویسندگان
Faridur Rahman, Jo Onoda, Koji Imaizumi, Seigi Mizuno,