کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5424924 | 1395842 | 2007 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of à to more than 1000 à ). At the same time one resolves the elastically scattered electrons into different components, corresponding to scattering of atoms with different mass (so-called 'electron Rutherford backscattering'). Thus these high-energy REELS/elastic scattering experiments obtain information on both the electronic structure and the atomic composition of the overlayer formed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 601, Issue 21, 1 November 2007, Pages 4862-4872
Journal: Surface Science - Volume 601, Issue 21, 1 November 2007, Pages 4862-4872
نویسندگان
M. Vos, M.R. Went,