Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials

We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.