The dynamics of He+ ion neutralization at a xenon film: Energy- and spin-resolved studies

The neutralization of He+ ions with energies in the range 10-500 eV at an adsorbed xenon layer is examined both by analyzing the energy distribution of electrons ejected from the surface and by use of spin-labeling techniques, specifically the use of electron-spin-polarized He+ ions coupled with measurement of the ejected electron polarization. The data indicate that neutralization proceeds via an Auger process similar to that which occurs at a clean high-work-function metal surface. At the higher ion energies, however, kinetic ejection becomes important and provides an increasing contribution to the total electron yield.