کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5442974 | 1510769 | 2017 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Titanium distribution profiles obtained by luminescence and LIBS measurements on Ti: Al2O3 grown by Czochralski and Kyropoulos techniques
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The titanium distributions in Ti-doped sapphires grown by Czochralski and Kyropoulos techniques were evaluated using Laser-Induced Breakdown Spectroscopy (LIBS) and luminescence characterizations. Distinctly different radial profiles of Ti4+ distribution were observed in the as grown Ti: Al2O3 crystals. The Ti4+ distribution in the crystal grown by Kyropoulos technique was analyzed as a function of the specific of the growth technique, the conclusion is significant for Ti: sapphire on laser application. Kyropoulos technique presents an advantage to reduce the proportion of Ti4+ in Ti: sapphire comparing to Czochralski technique.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 65, March 2017, Pages 28-32
Journal: Optical Materials - Volume 65, March 2017, Pages 28-32
نویسندگان
Guillaume Alombert-Goget, Florian Trichard, Hui Li, Cyril Pezzani, Maud Silvestre, Nicolas Barthalay, Vincent Motto-Ros, Kheirreddine Lebbou,