Investigation of the optimum oscillation frequency value towards increasing the efficiency of OBIST approach

• The appropriate value of the oscillation frequency can increase the fault coverage.
• Comparison of the OBIST efficiency in covering shorts in two different technologies.
• Dependence of fault coverage on the value of oscillation frequency was investigated.
• OBIST efficiency can be enhanced also for ICs designed in nanoscale technologies.

This paper is mainly focused on the investigation of the optimum value of the oscillation frequency in the Oscillation-based Built-In Self Tests (OBIST). It has been assumed that the proper frequency value might increase the test efficiency in covering hard-detectable short faults in analog integrated circuits (ICs) designed in nanoscale technology. In our research, active analog filters designed in 0.35 μm and 90 nm CMOS technologies were used as circuits under test (CUT). The tested circuits were brought to oscillation at different oscillation frequencies by varying the values of passive devices. The achieved results prove that the efficiency of OBIST approach can be increased in this way.