Properties of transparent conducting quaternary silver indium tin oxide thin films crystallized with delafossite structure

A study on crystalline silver indium tin oxide (AISO), a quaternary compound formed by tin incorporation in delafossite AgInO2 is briefed here. X-ray diffraction for structural characterization combined with energy dispersive analysis of X-rays for composition assessment confirms the formation of crystalline thin films with the rhomb-centered rhombohedral delafossite crystalline lattice. The variation in electrical conductivity (101-102 S/cm) and activation energy are correlated with carrier concentration and c-axis orientation induced by stoichiometric changes. A band gap tuning from 2.38 eV to 3.23 eV is achieved by the stoichiometry changes.