کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
544979 | 871796 | 2014 | 6 صفحه PDF | دانلود رایگان |

• The interfacial reactions in the Sn–58Bi/Alloy 42 and Sn–0.7Cu/Alloy 42 couples were systematically investigated.
• Only the FeSn2 phase was formed in both couples.
• The growth mechanism of the FeSn2 phase was diffusion controlled.
• This information is very interesting and valuable for soldering community.
Eutectic Sn–58 wt%Bi (SB) and Sn–0.7 wt%Cu (SC) lead-free solders reacting with Alloy 42 substrates were investigated at 240, 270, 300, and 330 °C for various reaction times. The FeSn2 phase was the only phase formed at the solder/Alloy 42 interface for all couples. However, this FeSn2 phase had two different microstructures. The intermetallic compound (IMC) morphology near the solder/Alloy 42 interface was dense with a tiny microstructure after reflowing at 240 °C. Massive spalling FeSn2 phases with large and platy grain were observed in the solder matrix. When the reflow temperature was increased the IMC morphology assumed bulk or cylindrical shape with no spalling IMCs observed at the solder/Alloy 42 interface. The IMC thickness increased with increasing reaction temperature and time. Both SB/Alloy 42 and SC/Alloy 42 couples presented a diffusion controlled growth mechanism in. The activation energies for SB/Alloy 42 and SC/Alloy 42 couples were 86.2 and 103.4 kJ/mol, respectively.
Journal: Microelectronics Reliability - Volume 54, Issue 1, January 2014, Pages 233–238