کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
544992 | 871796 | 2014 | 4 صفحه PDF | دانلود رایگان |

• An 8-level 3-bit cell programming technique is presented in SONOS memory devices.
• This new programming mode enlarges one time programming and sensing window.
• The storage density of the 8-level cell is greatly improved.
• The cycling endurance and retention properties are not obviously degraded.
An 8-level 3-bit cell programming technique is presented in NOR-type nano-scaled polycrystalline silicon-oxide–nitride-oxide-silicon (SONOS) memory devices. This new operating mode provides the double programming and sensing window over the traditional 4-level cell programming by using a double-side hot hole injection erasing. Compared with the 4-level cell, the storage density of the 8-level cell is greatly improved. However, the cycling endurance and retention properties are not obviously degraded until 1000 program/erase cycling.
Journal: Microelectronics Reliability - Volume 54, Issue 1, January 2014, Pages 331–334