کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5451473 1398537 2017 15 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد شیمی مواد
پیش نمایش صفحه اول مقاله
Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials
چکیده انگلیسی
Progress in recent research is briefly reviewed to highlight the potential when using latest S/TEM methodology optimized for atomic scale investigations and how this can be extended to in situ studies of interfacial effects, followed by comments on how to achieve and maintain highest possible resolution & sensitivity when keeping the effect of electron beam under control during these atomic-scale in situ experiments.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Opinion in Solid State and Materials Science - Volume 21, Issue 2, April 2017, Pages 77-91
نویسندگان
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