کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545164 1450553 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Determination of the stress level for voltage screen of integrated circuits
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Determination of the stress level for voltage screen of integrated circuits
چکیده انگلیسی

Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine the stress voltage by a general rule of thumb (focusing on one specific mechanism) without taking into account the particularities and the knowledge of the specific process.This paper describes a general approach to determine a safe level for voltage screening of products. In this approach, the onset of the wearout phase is not allowed to shift more than 1%. All the information needed to determine the voltage value is in general typically available from the process reliability tests performed as part of the process qualification.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 50, Issues 9–11, September–November 2010, Pages 1210–1214
نویسندگان
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