VLSI functional analysis by dynamic emission microscopy

Dynamic light emission gives a unique opportunity to record and analyse all photons emitted by a device under test inside the time resolved imaging sensor field of view. Gates switches can be precisely localised allowing functional analysis of the device for many purposes. Long duration acquisition, poor signal to noise ratio, huge amount of data to process and Near Infrared shift related to low power supply voltages have limited the use of this technique. The work presented in this paper present the last developments done to solve all these issues.