کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
545233 | 1450553 | 2010 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
AlInGaP LEDs are widely used in illumination applications as automotive and signalization due their low consumption and high durability. In order to verify the high durability data it is necessary to consider not only catastrophic failures but also degradation. In this work LEDs degradation at different temperature and drive current accelerated tests have been analyzed. In all the tests we have carried out an exponential degradation trend have been observed. Temperature and drive current influence in degradation rate and reliability have been evaluated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 50, Issues 9–11, September–November 2010, Pages 1559–1562
Journal: Microelectronics Reliability - Volume 50, Issues 9–11, September–November 2010, Pages 1559–1562
نویسندگان
M. Vázquez, N. Núñez, E. Nogueira, A. Borreguero,