کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545238 1450553 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Preliminary, space focused, reliability tests on European GaN HEMTs
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Preliminary, space focused, reliability tests on European GaN HEMTs
چکیده انگلیسی

ESA is investing significant efforts towards developing a European, space qualified, GaN supply chain for microwave components. Numerous R&D projects have been completed, or are ongoing, that focus on areas such as epitaxial growth, transistor electrical performance and reliability enhancement, e.g. in projects such as GREAT2. In order to perform independent verification and validation, ESA has also begun to modernise and re-equip its microwave component laboratory to augment the well established materials and component test capabilities. This paper describes the laboratory capabilities and provides some preliminary results and lessons learned from performing high temperature storage, hydrogen poisoning and DC step stress tests on European sourced GaN samples.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 50, Issues 9–11, September–November 2010, Pages 1581–1586
نویسندگان
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