کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545242 1450553 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches
چکیده انگلیسی

The influence of the bias signal waveform on the electromechanical dynamic response of ohmic RF-MEMS switches is here investigated by means of electromechanical characterizations and modelling procedures. The actuation transient of ohmic RF-MEMS switches was studied in this work developing a fast to compute, but comprehensive electromechanical model, using electromechanical parameters from experimental results. The developed model was then used to investigate how different bias waveforms influence the switch dynamic, in terms of actuation time, and bounces occurrences, and a practical solution to limit bounces, without compromising the actuation time was presented. Furthermore, it was demonstrated how it is possible to improve the reliability to cycling stress using ad hoc shaped bias signals.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 50, Issues 9–11, September–November 2010, Pages 1604–1608
نویسندگان
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