کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545376 871817 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Non-ideal effects improvement of SF6 plasma treated hafnium oxide film based on electrolyte–insulator–semiconductor structure for pH-sensor application
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Non-ideal effects improvement of SF6 plasma treated hafnium oxide film based on electrolyte–insulator–semiconductor structure for pH-sensor application
چکیده انگلیسی

A novel HfO2 thin film with SF6 plasma treatment as ion selective membrane on electrolyte–insulator–semiconductor structure for pH-sensor was proposed. The sensing characteristics on hydrogen ion detection and the non-ideal effects including drift effect, hysteresis phenomenon, and responses on interference ions were all presented in this article. The results show that the slight increase of pH-sensitivity is achieved and the non-ideal effects are improved after SF6 plasma treatment. It is finally concluded that the HfO2 thin film with SF6 plasma treatment as ion selective membrane is suitable for pH detection and the optimum condition is 5 min for SF6 plasma treatment.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 50, Issue 5, May 2010, Pages 742–746
نویسندگان
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