کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5454794 1514363 2017 37 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effects of Ag addition on solid-state interfacial reactions between Sn-Ag-Cu solder and Cu substrate
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Effects of Ag addition on solid-state interfacial reactions between Sn-Ag-Cu solder and Cu substrate
چکیده انگلیسی
Low-Ag-content Sn-Ag-Cu (SAC) solders have attracted much recent attention in electronic packaging for their low cost. To reasonably reduce the Ag content in Pb-free solders, a deep understanding of the basic influence of Ag on the SAC solder/Cu substrate interfacial reaction is essential. Previous studies have discussed the influence of Ag on the interfacial intermetallic compound (IMC) thickness. However, because IMC growth is the joint result of multiple factors, such characterizations do not reveal the actual role of Ag. In this study, changes in interfacial IMCs after Ag introduction were systemically and quantitatively characterized in terms of coarsening behaviors, orientation evolution, and growth kinetics. The results show that Ag in the solder alloy affects the coarsening behavior, accelerates the orientation concentration, and inhibits the growth of interfacial IMCs during solid-state aging. The inhibition mechanism was quantitatively discussed considering the individual diffusion behaviors of Cu and Sn atoms, revealing that Ag inhibits interfacial IMC growth primarily by slowing the diffusion of Cu atoms through the interface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 124, February 2017, Pages 250-259
نویسندگان
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