کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5455327 | 1514640 | 2017 | 27 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of the deformation and phase transformation behavior of VC-free and VC-containing FeMnSi-based shape memory alloys by in situ neutron diffraction
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The stress-induced fcc-austenite to hcp-martensite transformation in the iron based shape memory alloy (SMA) Fe-17Mn-5Si-10Cr-4Ni with and without VC precipitates is investigated by in-situ neutron diffraction measurements upon uniaxial loading and unloading. Based on experimentally derived elastic moduli the critical resolved shear stress (CRSS) for the fcc to hcp phase transformation was calculated. VC precipitates promote the martensite transformation by shifting the CRSS from 152Â MPa to 85Â MPa. A nearly perfect plastic behavior is found for the (220) grains with a high Schmid factor of 0.47. While (220), (111) and (200) oriented grains exhibit a phase transformation, (311) grains plastically deform solely by slip. During plastic deformation a load redistribution from soft behaving (220) grains to hard behaving (200) orientated grains takes place. The presence of VC precipitates leads to a broadening of the stress interval at which a martensite transformation is induced. This is explained by spatially heterogeneously distributed martensite transformation temperatures which are caused by VC precipitates. The microstructural reason for pseudo-elasticity is found to be a combination of back transformation from hcp to fcc and a reversible motion of Shockley partial dislocations.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volume 703, 4 August 2017, Pages 314-323
Journal: Materials Science and Engineering: A - Volume 703, 4 August 2017, Pages 314-323
نویسندگان
C. Leinenbach, A. Arabi-Hashemi, W.J. Lee, A. Lis, M. Sadegh-Ahmadi, S. Van Petegem, T. Panzner, H. Van Swygenhoven,