کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545743 871848 2008 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Tensile tests of micro anchors anodically bonded between Pyrex glass and aluminum thin film coated on silicon wafer
چکیده انگلیسی

Micro anchor is a kind of typical structures in micro/nano electromechanical systems (MEMS/NEMS), and it can be made by anodic bonding process, with thin films of metal or alloy as an intermediate layer. At the relative low temperature and voltage, specimens with actually sized micro anchor structures were anodically bonded using Pyrex 7740 glass and patterned crystalline silicon chips coated with aluminum thin film with a thickness comprised between 50 nm and 230 nm. To evaluate the bonding quality, tensile pulling tests have been finished with newly designed flexible fixtures for these specimens. The experimental results exhibit that the bonding tensile strength increases with the bonding temperature and voltage, but it decreases with the increase of the thickness of Al intermediate layer. This kind of thickness effect of the intermediate layer was not mentioned in the literature on anodic bonding.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 48, Issue 10, October 2008, Pages 1720–1723
نویسندگان
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