Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation

This paper focuses on the detailed study of the unipolar recharging phenomenon of the nanocluster NVM cells based upon the electron emission from the nanodots and their subsequent neutralization. It is shown that electron emission from nanodots is a very fast and effective process with a time constant <5 ms, but the subsequent neutralization of the positive accumulated charge is strongly dependent on the excess of Si atoms stored in the nanodots.