کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
546088 1450563 2006 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices
چکیده انگلیسی

Commercial-grade plastic encapsulated semiconductor devices are now widely used in space and military equipment for their cost-per-performance and availability advantages over military type ceramic parts. However, many equipment manufacturers still perceive risks in their deployment, and conduct expensive and time-consuming screening and qualification programs to mitigate the potential risks associated with their use.This paper discusses the limitations of the screening and qualification approach currently employed by space equipment manufacturers to assess the long-term reliability of commercially-available plastic encapsulated semiconductor devices (PEDs) in deep space missions. In addition, the paper presents the value of the high temperature operating life (HTOL) data published by manufacturers of PEDs for mitigating the risks associated with the use of such devices in long-duration space applications, where steady-state temperature is the significant stress parameter.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 46, Issues 2–4, February–April 2006, Pages 360–366
نویسندگان
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