کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
546274 | 1450561 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Initial stage of silver electrochemical migration degradation
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Silver electrochemical migration results in the degradation of surface insulation resistance, and has been attributed to the dendritic bridge between adjacent conductors. We report on the surface insulation resistance decrease prior to the dendritic bridge. The silver ECM mechanism in the initial stage of resistance decrease was analyzed and has been determined to be due to the continuous generation and accumulation of silver ions. Resistance decrease paths may be established prior to the appearance of dendritic migration paths. The investigation shows that the initial stage of ECM is also the rate controlling stage.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 46, Issues 9–11, September–November 2006, Pages 1915-1921
Journal: Microelectronics Reliability - Volume 46, Issues 9–11, September–November 2006, Pages 1915-1921