کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
546280 871879 2006 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Historical review of compound semiconductor reliability
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Historical review of compound semiconductor reliability
چکیده انگلیسی

This discussion is meant to look back at reliability progress over the last thirty years and identify trends and shortcomings. The main body of published work came from the ROCS workshop. While the workshop addresses various specific issues individually, it is the accumulation of a variety of data, information, and experience which forms the basis of an assessment of reliability. In the end, reliability is simply an insightful perception of facts and statistics. After 20-years of workshop meetings and three decades of accumulation of compound semiconductor reliability information, it is time to review, compare, and discuss the progress and the future of reliability for compound semiconductors.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 46, Issue 8, August 2006, Pages 1218–1227
نویسندگان
,