کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5467392 1518615 2017 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Towards precision measurements on highly charged ions using a high harmonic generation frequency comb
ترجمه فارسی عنوان
در جهت اندازه گیری دقیق روی یونهای بسیار شارژ با استفاده از شانه فرکانس تولید هارمونیک بالا
کلمات کلیدی
یون های بسیار شارژ، طیف سنجی لیزری، شانه فرکانس، تولید هارمونیک بالا، حفره حفاری،
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
چکیده انگلیسی
Highly charged ions (HCI) offer many advantages over neutral and singly charged ions for probing fundamental physics. Recently they have been proposed as candidates for novel frequency standards. The project presented here aims at studying HCI with high precision in the extreme ultraviolet (XUV) region, where many of their transitions are located. To this end, an XUV light source is being developed, using a stabilized frequency comb to generate high-order harmonics inside the focus of an enhancement cavity. This optical resonator resides in an ultra-high vacuum (UHV) chamber and is designed to have a very tight focus. The generated XUV light will be guided to a cryogenic linear Paul trap, where trapped HCI are sympathetically cooled by Be+ ions. Individual comb lines can then be used to drive narrow transitions in HCI, enabling XUV spectroscopy with unprecedented accuracy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 408, 1 October 2017, Pages 285-288
نویسندگان
, , , , , , , , ,