کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
546782 | 871943 | 2014 | 7 صفحه PDF | دانلود رایگان |

• Long-term measurement of BTI degradation from on-chip sensor is presented.
• Implemented on IBM’s z196 systems to monitor degradation under real-use conditions.
• Over 700 days worth of degradation data from customer systems is presented.
Long-term measurement of bias temperature instability (BTI) degradation obtained from an on-chip sensor is presented. The sensor reports measurements periodically with a digital output. Implemented on IBM’s z196 enterprise systems using IBM 45 nm technology, it can be used to monitor long-term degradation under real-use conditions. Over 700 days worth of ring oscillator degradation data from customer systems is presented. The data obtained by this sensor are consistent with models based on accelerated testing.
Journal: Microelectronics Reliability - Volume 54, Issue 11, November 2014, Pages 2371–2377