کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
546810 871943 2014 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Delay and crosstalk reliability issues in mixed MWCNT bundle interconnects
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Delay and crosstalk reliability issues in mixed MWCNT bundle interconnects
چکیده انگلیسی


• Introduced different configurations of mixed MWCNT bundle (MMB) interconnects.
• 4-shell, 8-shell and 12-shell MWCNTs are specifically arranged in MMB configurations.
• Presented an equivalent single conductor model of mixed MWCNT bundle interconnects.
• Analyzed and compared the performance of MWCNT bundle (MB) and MMB configurations.
• Compared to MB, the MMB interconnect reduces delay and crosstalk by 15.33% and 29.59%, respectively.

Multi-walled carbon nanotube (MWCNT) bundles have potentially provided attractive solution in nanoscale VLSI interconnects. In current fabrication process, it is not trivial to grow a densely packed bundle having MWCNTs with similar number of shells. A realistic nanotube bundle, in fact, is a mixed CNT bundle consisting of MWCNTs of different diameters. This research paper presents an analytical model of mixed CNT bundle wherein MWCNTs having different number of shells are densely packed. Two different types of MWCNT bundles are presented: (1) MB that contains MWCNTs with similar number of shells (i.e., uniform diameters) and (2) MMB wherein MWCNTs having different number of shells (i.e., non-uniform diameters) are mixed. Multi-conductor transmission line theory is used to present an equivalent single-conductor (ESC) model of different MB and MMB configurations. Using the ESC model, performance is analyzed to address the effect of propagation delay, crosstalk and power dissipation that explores the reliability of an interconnect wire. It is observed that using an MMB arrangement, the overall reduction in delay and crosstalk are 15.33% and 29.59%, respectively, compared to the MB for almost similar power dissipation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issue 11, November 2014, Pages 2570–2577
نویسندگان
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