Multi-physics reliability simulation for solid state lighting drivers

• A new system level methodology to study the reliability of SSL drivers.
• Integration of the component behavior in a system level simulation.
• Help understanding electrical/thermal behavior of the device during its lifetime.
• Predict the device lifetime by monitoring the device functionality.
• Specifying the most effective parameters on component level on the failure cause.

This paper is introducing a multi-physics reliability simulation approach for solid state lighting (SSL) electronic drivers. This work explores the system-level degradation of SSL drivers by means of applying its components reliability information into a system level simulation. Reliability information of the components such as capacitor, and inductor, defines how a component electrical behavior changes with temperature, and also with time. The purpose of this simulation is to understand the thermal–electrical behavior of SSL electronic drivers through their lifetime. Once the behavior of the device during its lifetime is understood, the real cause of the failure can be distinguished and possibly solved.