کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547048 871968 2012 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
System-level design optimization of reliable and low power multiprocessor system-on-chip
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
System-level design optimization of reliable and low power multiprocessor system-on-chip
چکیده انگلیسی

In this paper, we study the impact of application task mapping on the reliability of multiprocessor system-on-chip (MPSoC) application in the presence of soft errors. Based on this study, we propose a novel system-level design optimization of an MPSoC application through joint power minimization and reliability improvement. The power minimization is carried out using voltage scaling technique, while reliability improvement is achieved through careful choice of application task mapping on the homogeneous MPSoC processing cores. The overall aim is to minimize the number of single-event upsets (SEUs) experienced by the MPSoC application for suitably identified voltage scaling of the system processing cores such that the power is reduced and the specified real-time constraint is met. We evaluate the effectiveness of the proposed design optimization using a number of different applications, including MPEG-2 video decoder and synthetic applications. We show that for an MPEG-2 decoder with four processing cores, the proposed soft error-aware optimization produces a design with 38% less SEUs than soft error-unaware design optimization for an arbitrary soft error rate of 10−9, while consuming 9% less power and meeting a given real-time constraint. Furthermore, we investigate the impact of architecture allocation (allocation of processing cores) and show that for an MPSoC with six processing cores and a given real-time constraint, the proposed optimization produces design with up to 7% less SEUs compared to soft error-unaware designs at the cost of 5.5% higher power.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issue 8, August 2012, Pages 1735–1748
نویسندگان
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