کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547057 871975 2012 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Developing the stress–strain curve to failure using mesoscale models parameterized from molecular models
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Developing the stress–strain curve to failure using mesoscale models parameterized from molecular models
چکیده انگلیسی

Developing the stress response using the molecular and mesoscale levels is fairly reliable during the initial strain. For instance, modulus is a property that can be established using these techniques and the continuity of scale between the molecular and mesoscale and agreement with experiment suggests that both may be used to establish modulus for parameterizing a macroscale model when measured properties are unavailable. However, the latter part of the stress–strain response that helps to establish ties to crack propagation still needs attention. One problem that was previously found in the mesoscale models was questionable lack of void formation in crosslinked systems due to superficially clean adhesive separation in the simulations. One way to overcome this lack of voiding was to determine how to develop bond breakage criterion that would allow surfaces to develop. This paper discusses development and application of bond breakage on a mesoscale level (which uses a bead-bond breakage criterion so does not explicitly define which bond is broken), and the impact on the simulated stress–strain curves using mesoscale models.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issue 7, July 2012, Pages 1291–1299
نویسندگان
,