کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547062 871975 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Lifetime predictions of LED-based light bars by accelerated degradation test
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Lifetime predictions of LED-based light bars by accelerated degradation test
چکیده انگلیسی

The accelerated degradation of light bars was tested under different stresses called junction temperatures, which result from the combination of current and ambient temperature. Light bars are used as a light source in laptops. A general procedure for an accelerated degradation test was used to analyze the useful lifetime of light bars under operating conditions. The degradation behavior for each light bar was fitted by an exponential function. The impact of parameter variations and measurement errors were also considered. The failure criterion was defined as the 50% decrease of the emitted optical power, when compared with the initial level. The failure time is, accordingly, the time required to achieve that failure criterion. A response model based on an inverse power (exponential) law for the failure time under different stresses was then calculated to predict the lifetime under operating conditions. The results show that the failure time of a light bar under operating conditions is about 11,571 h.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issue 7, July 2012, Pages 1332–1336
نویسندگان
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