Reliability evaluation for single event crosstalk via probabilistic transfer matrix

To quantitatively analyze the influence on integrated circuits (ICs) by crosstalk and single event effects, the reliability of ICs under these effects was evaluated via probabilistic transfer matrix (PTM). The basic theory of PTM was briefly introduced. By modifying the right probability of gates in PTM, the influence from single event effect on the reliability was obtained. By considering the error probability of signal transportation through interconnects, the reliability under crosstalk was calculated. The results show that crosstalk and single event effects will both decrease the reliability of ICs. The farther from the output the gate is suffered from single event effect, the less significant influences on the reliability decreased. The crosstalk effects will bring worse influences on the reliability than single event effects. The technologies for improving reliability of ICs should take more attentions to the crosstalk effects and multi-single event effects.