کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547231 871991 2012 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Overview of low temperature hydrophilic Ge to Si direct bonding for heterogeneous integration
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Overview of low temperature hydrophilic Ge to Si direct bonding for heterogeneous integration
چکیده انگلیسی

Germanium is gaining interest in two important areas of electronics; for high performance metal oxide semiconductor field effect transistors due to the high carrier mobility and for imaging and optical applications due to its superior absorption in the infrared range. Optimally, germanium will be integrated with existing silicon electronics to enhance electrical and optical properties. One method for integration of germanium with silicon is direct wafer bonding of the two materials. In this paper, wafer-level germanium–silicon heterogeneous integration technologies are investigated and described in detail, including structural and electrical features of bonded hetero-structure.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issue 2, February 2012, Pages 325–330
نویسندگان
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