کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547374 871995 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improving an LDMOST by variation of lateral doping on epitaxial-layer drift region
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Improving an LDMOST by variation of lateral doping on epitaxial-layer drift region
چکیده انگلیسی

Variation of lateral doping (VLD) is applied to the epitaxial-layer drift region in LDMOSTs, resulting in non-uniform doping concentration. In addition to a decrease in on-resistance, it improves electric field distribution on the surface of drift region, and thus increases the breakdown voltage. We studied the condition of using the VLD technique, and compared it with the conventional technique of optimizing the epitaxial-layer uniform concentration. Results from TSPUREM 4 and MEDICI simulations indicate that when the epitaxial-layer doping concentration is 1.5 × 1015 cm−3, applying VLD to the drift region increases the breakdown voltage by as much as 34% (187–251 V), while the specific on-resistance is lowered by 55% (49–22 mΩ cm2), which are remarkable improvements. On the other hand, if the doping concentration of epitaxial-layer is already high, the improvement of applying VLD is limited.


► We study variation of lateral doping (VLD) on epitaxial drift region in LDMOSTs.
► We study the condition of using VLD to improve breakdown voltage and on-resistance.
► The VLD is most effective when the epitaxial-layer doping concentration is low.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 51, Issue 12, December 2011, Pages 2059–2063
نویسندگان
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