کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
547514 1450558 2007 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Reliability methods and standards
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Reliability methods and standards
چکیده انگلیسی

This tutorial focuses on three aspects of standardization: existing standards and organizations, evolution of standards and creation of new standards, new developments.An overview of existing standards and involved organizations is given. The main standardization institutes and forums for semiconductor reliability are described.The process of introducing new standards and changes is described. New and changed standards are needed when technologies change and when increased knowledge leads to better methods. Also, new application areas and changed customer requirements may lead to changed or new methods.Advantages and disadvantages of standards are discussed, with emphasis on standards for qualification. Development and use of knowledge-based methods is addressed.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 47, Issues 9–11, September–November 2007, Pages 1330–1335
نویسندگان
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