کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
547600 | 1450558 | 2007 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
In this work, temperature inhomogeneities inside IGBT modules are measured to assess their relevance for the component reliability. Such issue has not been considered in many previous studies, since it is often assumed that the electro-thermal characteristics of IGBTs compensate for such temperature differences. Starting from real temperature measurements, this work discusses such aspect aided by electro-thermal simulations. This method provides useful information for the reliable thermal design of power modules, also considering the actual cooling system.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 47, Issues 9–11, September–November 2007, Pages 1784–1789
Journal: Microelectronics Reliability - Volume 47, Issues 9–11, September–November 2007, Pages 1784–1789
نویسندگان
X. Perpiñà, A. Castellazzi, M. Piton, M. Mermet-Guyennet, J. Millán,