Dynamic responses and solder joint reliability under board level drop test

Board level solder joint reliability during drop test is a great concern to semiconductor and electronic product manufacturers. In this paper, the comprehensive dynamic responses of printed circuit boards (PCBs) and solder joints, e.g., acceleration, strains, and resistance, are measured and analyzed in detail with a multi-channel real-time electrical monitoring system. Control and monitoring of dynamic responses are very important to ensure consistent test results and understand the mechanical behaviors, as they are closely related to the solder joint failure mechanism. The effects of test variables, such as drop height, number of PCB mounting screws, tightness of screws, and number of felt layer, are studied by comparing and analyzing the dynamic responses. A good repeatability of testing can only be achieved when careful attentions are paid on these factors. The relationships among drop height, peak acceleration, pulse duration, and impact energy are unique for a drop tester, and therefore, it should be characterized prior to the reliability tests. The studies also help to determine the requirements of new impact pulse quickly. The bending mode shapes and frequencies of PCB are extracted from dynamic strains and images token by high-speed camera. A real-time dynamic resistance monitoring method is developed to study the solder joint reliability. The solder joint failure process, i.e. crack initiation, propagation, and opening, is well understood from the behavior of dynamic resistance. It is found experimentally that the mechanical shock causes multiple PCB bending or vibration which induces the solder joint crack failure. Cyclic changes of dynamic resistance indicate that the solder joint crack opens and closes when PCB bends up and down.