کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
548587 | 1450562 | 2006 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
New insights into board level drop impact
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
This paper presents new insights into board level drop impact using analytical relations that have been developed. The dominance of bending moment as a failure driver leads naturally to the dynamic–static analysis technique, which together with the dominance of fundamental flexing mode led to a simple relation for interconnection stress. Using this relation, it has been found that miniaturisation of interconnection with accompanying reduction in load bearing area is the most significant source of drop impact vulnerability. Finally, a low cost PCB has been proposed with equivalent dynamic characteristic and near equivalent interconnection stress as the eight-layer microvia board specified in JEDEC Std JESD22-B111.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 46, Issues 5–6, May–June 2006, Pages 930–938
Journal: Microelectronics Reliability - Volume 46, Issues 5–6, May–June 2006, Pages 930–938
نویسندگان
E.H. Wong, Y.-W. Mai,